undefined

undefined

PE-100 Series

PE-100 Series

107-1(1776065565062).jpg
107-2(1776065565070).jpg
107-3(1776065565080).jpg
107-4.jpg
107-5.jpg
107-6(1776065565453).jpg
107-7(1776065565469).jpg
107-8(1776065565489).jpg
107-9(1776065565535).jpg
107-10(1776065565514).jpg

Overview

Technical Specifications

Product Advantages

Product Applications

Product Overview

The PE-100 Series is a robust, floor-standing Scanning Electron Microscope (SEM) that integrates power with precision. Utilizing a high-performance tungsten filament source, it delivers exceptional high-resolution imaging and analytical results, revealing the finest details of the microscopic world with stunning clarity.

Technical Specifications

Resolution 3.0 nm
Voltage 1 kV ~ 30 kV
Stage 5-axis motorized stage
Stage Travel XYZ: 50 mm x 50 mm x 50 mm
T: -20°~ 45°
R: 360°
Max Sample Size D: 140 mm,H: 45 mm
Standard Detectors ET-SE
Chamber CCD
Optical Navigation Camera
Options BSED
EDS、EBSD、Others

Product Advantages

● High-Quality Imaging: Flexible SE & BSE imaging
● Dual Navigation System: Chamber camera + optical navigation
● Retractable BSE Detector :Faster & Safer 
● Smart Operation: Automated workflows with intuitive Multi-language GUI
● Easy Maintenance: Pre-centered tungsten filament for fast replacement
● Powerful Expandability: LV mode, EDS, EBSD, and other accessories

Product Applications

Semiconductor chip - scale-free
Metal mesh with layer 100X - foam metal
Metal mesh with layer 500X - foam metal

Previous page:

Next page:

Submit your request

Submit

Related Products

Submit